The manuscript proposes a truncated near-field microwave microscope structure, which is composed of a re-entrant coaxial cavity and a coplanar waveguide probe with two-sided symmetrical grounding. The ...

Pochet, S., Teyssedou, A. and Akyel, C. (2014) Development and Assessment of a Microwave Void-Fraction Measurement System. Review of Scientific Instruments, 85 ...

Microwave probes typically have two or more pins, and planarization is crucial in wafer testing. This study examines the planarization of microwave probes and determines the probe’s rotation angle ...