Feedback notes the flurry of new papers mentioning the mysterious "vegetative electron microscope", and ponders the emergence ...

for operating all ZEISS scanning electron microscopes (SEMs), including focused ion beam scanning electron microscopes (FIB-SEMs). Universal software designed to operate any ZEISS light or ...

ZEISS announces the introduction of its highly flexible and efficient software suite, ZEN core, for operating all ZEISS scanning electron microscopes (SEMs), including focused ion beam scanning ...

According to a market report by Lucintel, the future of the global electron microscopy market looks promising with ...

A new deep learning method called DLE-EM accelerates SEM imaging of geological materials by up to 16×, enabling large-scale, ...

For decades, traditional lithography techniques—such as electron beam lithography and nanoimprinting—have struggled to meet ...

A digital investigation reveals how AI can latch on to technical terminology, despite it being complete nonsense.

for operating all ZEISS scanning electron microscopes (SEMs), including focused ion beam scanning electron microscopes (FIB-SEMs). ZEN stands for ZEISS Efficient Navigation and lets microscopists ...

Czech-based electron microscope manufacturer TESCAN is undergoing a strategic shift, expanding into advanced semiconductor ...

The Navigation Workspace is designed to guide user workflows. Users can easily access essential electron microscopy (EM) control parameters through the top navigation tools, gaining a ...