Nature

At-Speed Testing and Delay Defect Analysis in Integrated Circuits

At-speed testing and delay defect analysis have become increasingly critical in ensuring the reliability and performance of modern integrated circuits. As circuit complexity grows alongside rapid ...
Nature

Adaptive Testing in Integrated Circuits Using Machine Learning

Adaptive testing in integrated circuits (ICs) has emerged as an innovative strategy to optimise and streamline the evaluation of increasingly complex semiconductor devices. By incorporating machine ...
EDN

The basics of testing op amps, part 1:

A version of Part 1 appeared in the Dec. 2011/Jan. 2012 issue of Test & Measurement World. See the PDF. In January 1979, Electronic Test published an article claiming that a single test circuit that ...
Business Wire

Agilent Technologies Introduces Medalist i5000 In-Circuit Test Platform

New System Offers Fastest Time-to-Money Ratio for Printed Circuit Board Assembly Manufacturers Agilent Technologies Inc. (NYSE:A) today introduced an in-circuit test (ICT) system that delivers the ...